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CLAL IND (TASE: CII)
13.89 ILS  -0.36 (-2.53%)
Daily Price  /  Updated: 5:14 AM EDT, May 23, 2013  /  Add to My Watchlist      
View: Quote News
Press releases about CLAL IND
 
Jordan Valley's QC3 Diffractometer Was Announced as the Winner of CS Industry Metrology Tool Awards 2013
March 04, 2013
from PR Newswire
Jordan Valley Named Among Deloitte's Fast 50 Israel Technology Companies for 2012
October 18, 2012
from PR Newswire
IDB Development Completes Sale of 49.9% in Clal Industries to Access Industries
July 05, 2012
from PR Newswire
IDB Group Agrees to Sell 49.9% Stake in Clal Industries to Access Industries
May 20, 2012
from PR Newswire
Jordan Valley Named Among 2011 50 Fastest Growing Companies in Israel by Deloitte Technology Fast 50
October 04, 2011
from PR Newswire
Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
June 16, 2011
from PR Newswire
Jordan Valley Semiconductors Announces a New Order From Invenlux Optoelectronics (China) for its QC3(TM) HRXRD Tool, a High Throughput, Multiple Wafer Size Diffractometer, Used for epi Layers Quality
January 05, 2011
from PR Newswire
Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors
November 16, 2010
from PR Newswire
Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput
July 13, 2010
from PR Newswire
Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200 Metrology Production Tools from Tier One Semiconductors Manufacturer
June 24, 2010
Visit Us at Semicon West, July 2010, Wafer Processing Booth #2607 Read More
from PR Newswire
Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
April 28, 2010
from PR Newswire
X-Ray-based Metrology leader Jordan Valley Semiconductors Acquires Assets of Semiconductor Equipment Supplier Metrosol
March 22, 2010
from PR Newswire
Jordan Valley Semiconductors Announces 2009 Year-end Performance
March 18, 2010
from PR Newswire
Jordan Valley Semiconductors (JVS) Targets Quality Control in LED and Compound Semiconductor Manufacturing
February 01, 2010
The Company Launches the QC3(TM), a High Resolution XRD (X-Ray Diffraction) System for the LED and Compound Semiconductors Manufacturing Process Quality Control Read More
from PR Newswire
Jordan Valley Announces Delivery of the JVX6200 XRR Metrology Tool to a Leading-Edge HDD (Hard Disk Drive) Manufacturer
September 22, 2009
from PR Newswire
TSMC Adopts Jordan Valley JVX 6200 for Copper Layer Metrology
April 15, 2009
from PR Newswire
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