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Advantest Corp. ADS
(NY:
ATE
)
16.34
USD
-0.23 (-1.39%)
Official Closing Price
/ Updated:
6:40 PM EDT, Jun 19, 2013
/
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Press releases about Advantest Corp. ADS
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Antibe Therapeutics Completes $2.27 Million Financing and Lists on the TSX Venture Exchange
June 18, 2013
from
Marketwired
Advantest Develops Terahertz Wave Spectroscopy and Imaging Analysis Platform
June 05, 2013
from
Business Wire News Releases
Advantest Chairman Toshio Maruyama Appointed Chairman of Semiconductor Equipment Association of Japan
May 30, 2013
from
Business Wire News Releases
Advantest Earns 25th Consecutive Ranking as a Top Semiconductor Test Equipment Supplier in the Annual VLSIresearch Customer Satisfaction Survey
May 23, 2013
from
Business Wire News Releases
Advantest's President and CEO Haruo Matsuno Earns ACE Award for Executive of the Year
May 09, 2013
2012 Accomplishments Include Managing Advantest's Integration of Verigy, Maintaining ATE Leadership and Pioneering New Business Opportunities
Read More
from
Marketwired News Releases
Advantest's VOICE 2013 Semiconductor Test Conference Attracts Over 300 Attendees From Around the World
May 09, 2013
from
Marketwired News Releases
Advantest Acquires W2BI
April 25, 2013
Secures System Level Test Automation Software Solution
Read More
from
Marketwired News Releases
Advantest Earns Supplier Excellence Award From Texas Instruments
April 11, 2013
TI Using Advantest's M4841 Pick-and-Place Handlers With Its Automated Test Equipment
Read More
from
Marketwired News Releases
Advantest Installs Multiple V93000 Dragon Testers at Powertech Technology Inc., a Leading Taiwanese Test and Assembly Foundry
April 11, 2013
New Dragon Testers Selected for Their Ability to Achieve Lowest Cost of Test for a Variety of SOC Devices
Read More
from
Marketwired News Releases
Advantest Enters MEMS Testing Market With Multiple System Installations at Freescale(R) Semiconductor's Facilities in Arizona and Asia
March 28, 2013
V93000 Smart Scale(TM) Testers With Small A-Class Test Heads and Pin Scale 1600 Cards Qualified for High-Volume, Low-Cost Testing of MEMS-Based Sensors
Read More
from
Marketwired News Releases
Advantest VOICE 2013 Conference to Feature High Quality Presentations for SOC Platforms and Handlers
February 14, 2013
Registration Open for April 23-25 Conference in San Jose
Read More
from
Marketwired News Releases
Advantest Expands Application Coverage of TAS7500 Series of Spectroscopic Imaging Systems with 2 New Systems; Transmittance Polarization Analysis Module Also Developed
February 04, 2013
from
Business Wire News Releases
Free Research Report on Zynga Inc., Groupon, Inc., Advantest Corp., Nidec Corp. and Power-One, Inc.
January 30, 2013
from
PR Newswire
Advantest's New Test Cell Selected by Marvell Semiconductor to Reduce Cost of Test for High-Volume, Cost-Sensitive ICs
January 08, 2013
Based on Evaluation Unit's High Performance, the x16 Parallel Test Cell Has Been Released for Production for Marvell Products
Read More
from
Marketwired News Releases
Advantest Sponsors Global Semiconductor Association Awards Dinner
December 10, 2012
from
Business Wire News Releases
Advantest Announces VOICE 2013 User's Conference for System-on-Chip and Memory Semiconductor Devices and Handler Test Technologies
December 05, 2012
Seventh Annual VOICE Conference Includes Fully Integrated Tracks Featuring Advantest's T2000, V93000 and Memory Test Platforms
Read More
from
Marketwired News Releases
Advantest Introduces New T2000 3Gbps CMOS Image Capture Module for Industry-Leading T2000 ISS Semiconductor Test Platform
November 29, 2012
High-Speed Image Capturing and Highly Parallel Testing Help to Reduce Production Costs for CMOS Image Sensing Devices
Read More
from
Marketwired News Releases
Advantest Introduces T2000 8Gbps Digital Module for High-Speed Testing of SoCs With Serial, Parallel or Memory Interfaces
November 27, 2012
Versatile New Test Instrument Reduces Costs and Speeds Time to Market for New ICs
Read More
from
Marketwired News Releases
Advantest Develops EB Lithography System for 1Xnm Node
November 14, 2012
from
Business Wire News Releases
Advantest Develops Mask Defect Review SEM E5610 For Next-Generation Photomasks
November 14, 2012
from
Business Wire News Releases
Advantest Introduces New Wafer MVM-SEM Tool E3310
November 14, 2012
from
Business Wire News Releases
Advantest Introduces T2000 IMS for Low-Cost Testing of Integrated Microcontroller and Smart Card ICs
November 07, 2012
Company's Universal Pin Architecture Enables Massively Parallel Testing in a Single System
Read More
from
Marketwired News Releases
Advantest Establishes Princeton Facility to Support Sales of TAS7500 Terahertz Spectroscopic/Imaging Analysis System
October 10, 2012
from
Business Wire News Releases
Advantest Establishes New Subsidiary Cloud Testing Service, Inc.
October 01, 2012
from
Business Wire News Releases
Advantest Develops THz TOF Tomography Analysis System
September 04, 2012
from
Business Wire News Releases
Semiconductor Test Equipment Leader Advantest Completes Move of U.S. Headquarters to San Jose, Calif.
August 30, 2012
Consolidates Silicon Valley Operations Into a Single Facility Designed for Increased Efficiency and Low Environmental Impact
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from
Marketwired News Releases
Advantest’s Terahertz Spectroscopic/Imaging System TAS7500 Adopted by Astellas Pharma Inc.
August 30, 2012
from
Business Wire News Releases
Advantest Wins Best Supplier Award From STATS ChipPAC
July 26, 2012
V93000 Test Platform Recognized for Fifth Year in a Row
Read More
from
Marketwired News Releases
Advantest to Showcase Comprehensive Line-up of SOC and Memory Platforms at SEMICON West 2012
July 09, 2012
Booth to Feature Complete Portfolio of Testers, Probe Cards and Handlers
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from
Marketwired News Releases
Advantest Introduces Industry's Highest Capability 3-in-1 Semiconductor Test Clock Module to Improve Yields and Save Time & Money in Testing High-Speed ICs
July 05, 2012
Module's Ability to Test All Variations of Clock Requirements Enables Greater Test Coverage in a Single System
Read More
from
Marketwired News Releases
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