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Aehr Test Systems - Common Stock (NQ:AEHR)

107.06 +5.46 (+5.37%)
Delayed Quote Updated: 12:36 PM EDT, Oct 2, 2026 Add to My Watchlist
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Press Releases about Aehr Test Systems - Common Stock

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Aehr Test Systems to Participate in 18th Annual CEO Investor Summit 2026 in San Francisco
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Test Systems to Participate in the 10th Annual Lake Street Capital Markets Best Ideas Growth Conference on September 10
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Test Systems to Participate in the Jefferies Semiconductor, IT Hardware & Communications Technology Conference on August 25, 2026
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 19
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Receives $22 Million Follow-On Order for AI Processor Wafer-Level Burn-In Systems
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Test Systems Expands Silicon Photonics Production Momentum with Follow-On Production Order from Lead Customer
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Test Systems Reports Fiscal 2026 Fourth Quarter and Full Year Financial Results with Record Quarterly Bookings and $100 Million Effective Backlog
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Receives More Than $8 Million in New Silicon Carbide Wafer-Level Burn-In Orders as Global Electric Vehicle Programs Accelerate
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Receives Follow-On Production Order from Lead Silicon Photonics Customer for Fully Automated FOX-XP Wafer-Level Burn-In System
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Test Systems to Announce Fiscal 2026 Fourth Quarter and Full Year Financial Results on July 14, 2026
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Receives Follow-On Order From Major Silicon Photonics Customer for Fully Automated Wafer-Level Burn-In System for Hyperscale Data Center Optical Interconnect
From Aehr Test Systems
Via ACCESS Newswire
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Aehr Test Systems to Present at William Blair 46th Annual Growth Stock Conference on June 2
Via ACCESS Newswire
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Aehr Test Systems to Participate in the 23rd Annual Craig-Hallum Institutional Investor Conference on May 28
Via ACCESS Newswire
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Aehr Receives Record $41 Million Production Order from Lead Hyperscale AI Customer; Second-Half Bookings Exceed $92 Million
Via ACCESS Newswire
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Aehr Test Systems Reports Over $37 Million in Quarterly Bookings Driven by Strong AI and Data Center Infrastructure Demand
Via ACCESS Newswire
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Aehr Wins Major New Silicon Photonics Customer with High-Power FOX-XP Wafer-Level Burn-In System for Hyperscale Data Center Optical Interconnect Market
Via ACCESS Newswire
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Aehr Test Systems to Announce Third Quarter Fiscal 2026 Financial Results on April 7, 2026
Via ACCESS Newswire
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Aehr Receives Follow-On Order for Fully Automated Wafer-Level Burn-In Systems Powering AI Optical I/O and Data Center Interconnects
Via ACCESS Newswire
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Aehr Receives $14 Million Order from Lead AI Processor Customer for Multiple New Fully Automated FOX-XP Wafer Level Burn-In Systems
Via ACCESS Newswire
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Aehr Test Systems to Participate in the Susquehanna 15th Annual Technology Conference on February 26, 2026
Via ACCESS Newswire
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Aehr Secures Key AI Production Burn-in Win with Initial Order of Sonoma Systems for Lead Hyperscale Customer's Next-Generation AI ASIC Processors
Via ACCESS Newswire
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Aehr Announces Over $5.5 Million in Sonoma Ultra-High-Power System Orders to Test and Burn-in AI Processors; Introduces New Fully-Automated Sonoma for Next-Generation AI Applications
Via ACCESS Newswire
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Aehr Test Systems Reports Fiscal 2026 Second Quarter Financial Results and Reinstates Guidance Driven by Improved Visibility for AI Processor and Data Center Semiconductor Test and Burn-In Systems
Via ACCESS Newswire
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Aehr Test Systems to Present at the 28th Annual Needham Growth Conference on January 13
Via ACCESS Newswire
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Aehr Test Systems to Announce Second Quarter Fiscal 2026 Financial Results on January 8, 2026
Via ACCESS Newswire
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Aehr Test Systems to Participate in 14th Annual NYC Summit
Via ACCESS Newswire
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Aehr Seeing Momentum in Package-Level Burn-In Alongside Expanding Wafer-Level Burn-in Demand
Via ACCESS Newswire
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Aehr Test Systems and ISE Labs Announce Partnership on Wafer-Level Test and Burn-in for High-Performance Computing and Artificial Intelligence Processors
Via ACCESS Newswire
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Aehr Test Systems Reports Fiscal 2026 First Quarter Financial Results; Strong AI and Data Center-Related Semiconductor Test and Burn-in Activity Underscores Multi-Year Market Opportunity
Via ACCESS Newswire
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Aehr Test Systems to Announce First Quarter Fiscal 2026 Financial Results on October 6, 2025
Via ACCESS Newswire
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